Bruker AXS Microanalysis presents the XFlash 5000 series of liquid nitrogen free XFlash silicon drift detectors (SDD) for use with its QUANTAX microanalysis systems. These new detectors boast further improved energy resolutions down to 123eV at Mn-Ka and 100,000cps input count rate. All detectors are equipped with an optimised electron trap, which supports interference-free x-ray detection, even at very low excitation energies. The new XFlash 5000 family consists of 3 members: the XFlash 5010 is a 10mm² detector that provides superior light element performance; the second is the XFlash 5030 detector, which contains a 30mm² SDD chip in a detector endcap that is no wider than that of the XFlash 5010. Bruker’s XFlash QUAD 5040 detector is the third family member.
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Bruker AXS Microanalysis presents the XFlash 5000 series of liquid nitrogen free XFlash silicon drift detectors (SDD) for use with its QUANTAX microanalysis systems. These new detectors boast further improved energy resolutions down
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